| .. |
|
.gitattributes
|
Ensure Git applies Unix line-endings in tests (#18495)
|
4 年之前 |
|
ARMED-tests
|
Move tests up one level
|
4 年之前 |
|
BIGTREE_BTT002-tests
|
Move tests up one level
|
4 年之前 |
|
BIGTREE_GTR_V1_0-tests
|
Demo and test multiple PID defaults (#19413)
|
4 年之前 |
|
BIGTREE_SKR_PRO-tests
|
Move tests up one level
|
4 年之前 |
|
DUE-tests
|
Archim test matching env
|
4 年之前 |
|
DUE_archim-tests
|
Archim test matching env
|
4 年之前 |
|
FLYF407ZG-tests
|
Move tests up one level
|
4 年之前 |
|
FYSETC_F6_13-tests
|
More customizable DGUSDisplay (#18700)
|
4 年之前 |
|
FYSETC_S6-tests
|
Move tests up one level
|
4 年之前 |
|
LERDGEX-tests
|
Add Lerdge S,X,K (#18302)
|
4 年之前 |
|
LPC1768-tests
|
"Sound: ON/OFF" menu item (#19901)
|
4 年之前 |
|
LPC1769-tests
|
G34 Mechanical Gantry Calibration (like Prusa M915) (#18972)
|
4 年之前 |
|
NUCLEO_F767ZI-tests
|
Fix NUCLEO_F767ZI build, add tests (#19746)
|
4 年之前 |
|
SAMD51_grandcentral_m4-tests
|
Move tests up one level
|
4 年之前 |
|
STM32F4-tests
|
Move tests up one level
|
4 年之前 |
|
STM32F7-tests
|
Move tests up one level
|
4 年之前 |
|
STM32F070CB_malyan-tests
|
Update HAL/STM32 platform to 8.0 (#18496)
|
4 年之前 |
|
STM32F070RB_malyan-tests
|
Move tests up one level
|
4 年之前 |
|
STM32F103CB_malyan-tests
|
Move tests up one level
|
4 年之前 |
|
STM32F103RC_btt-tests
|
Catch a TMC address conflict early (#19458)
|
4 年之前 |
|
STM32F103RC_btt_USB-tests
|
Move tests up one level
|
4 年之前 |
|
STM32F103RC_fysetc-tests
|
Move tests up one level
|
4 年之前 |
|
STM32F103RC_meeb-tests
|
Move tests up one level
|
4 年之前 |
|
STM32F103RE-tests
|
Move tests up one level
|
4 年之前 |
|
STM32F103RET6_creality-tests
|
Ender 3 V2 BL24C16 EEPROM support (#18758)
|
4 年之前 |
|
STM32F103RE_btt-tests
|
Move tests up one level
|
4 年之前 |
|
STM32F103RE_btt_USB-tests
|
Move tests up one level
|
4 年之前 |
|
STM32F103VE_longer-tests
|
TFT Presets, Generic options, Sanity checks (#19723)
|
4 年之前 |
|
STM32F401VE_STEVAL-tests
|
Move tests up one level
|
4 年之前 |
|
STM32F407VE_black-tests
|
Move tests up one level
|
4 年之前 |
|
at90usb1286_cdc-tests
|
Move tests up one level
|
4 年之前 |
|
at90usb1286_dfu-tests
|
Fix LCD menus + DAC (#19907)
|
4 年之前 |
|
esp32-tests
|
Catch a TMC address conflict early (#19458)
|
4 年之前 |
|
jgaurora_a5s_a1-tests
|
Move tests up one level
|
4 年之前 |
|
linux_native-tests
|
Move tests up one level
|
4 年之前 |
|
malyan_M300-tests
|
HAL and serial cleanup
|
4 年之前 |
|
mega1280-tests
|
Allow bypass for cold E movement (#19606)
|
4 年之前 |
|
mega2560-tests
|
"Sound: ON/OFF" menu item (#19901)
|
4 年之前 |
|
mks_robin-tests
|
TFT Presets, Generic options, Sanity checks (#19723)
|
4 年之前 |
|
mks_robin_lite-tests
|
Sanity-check illegal native USB (#20047)
|
4 年之前 |
|
mks_robin_mini-tests
|
Support for TFT & Touch Screens (#18130)
|
4 年之前 |
|
mks_robin_nano35-tests
|
Standardize Marlin SPI (part 1) (#19989)
|
4 年之前 |
|
mks_robin_nano35_stm32-tests
|
Standardize Marlin SPI (part 1) (#19989)
|
4 年之前 |
|
mks_robin_pro-tests
|
Sanity-check illegal native USB (#20047)
|
4 年之前 |
|
mks_robin_stm32-tests
|
Support for TFT & Touch Screens (#18130)
|
4 年之前 |
|
rambo-tests
|
Fix 0 extruders & bed compile (#20030)
|
4 年之前 |
|
rumba32-tests
|
Move tests up one level
|
4 年之前 |
|
run_tests
|
Move tests up one level
|
4 年之前 |
|
sanguino644p-tests
|
Move tests up one level
|
4 年之前 |
|
sanguino1284p-tests
|
Move tests up one level
|
4 年之前 |
|
teensy31-tests
|
Move tests up one level
|
4 年之前 |
|
teensy35-tests
|
"Sound: ON/OFF" menu item (#19901)
|
4 年之前 |
|
teensy41-tests
|
Teensy 4.1 Ethernet support (#19801)
|
4 年之前 |
Jason Smith